Browsing Department of Physics and Technology by Journals "Ultramicroscopy"

Now showing items 1-2 of 2

    • Image formation in the scanning helium microscope 

      Fahy, Adam; Eder, Sabrina Daniela; Barr, Matt; Martens, Joel; Myles, T.A.; Dastoor, Paul C. (Peer reviewed; Journal article, 2018)
      The scanning helium microscope (SHeM) is a new addition to the array of available microscopies, particularly for delicate materials that may suffer damage under techniques utilising light or charged particles. As with all ...

    • Neutral helium atom microscopy 

      Palau, Adria Salvador; Eder, Sabrina Daniela; Bracco, Gianangelo; Holst, Bodil (Journal article; Peer reviewed, 2023)
      Neutral helium atom microscopy, also referred to as scanning helium microscopy and commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging technique that uses a beam of neutral helium atoms as an ...