• First irradiation test results of the ALICE SAMPA ASIC 

      Mahmood, Sohail Musa; Røed, Ketil; Velure, Arild; Winje, Fredrik (Peer reviewed; Journal article, 2018)
      With the continuous scaling of the CMOS technology, the CMOS circuits are considered to be more tolerant to Single event Latchup (SEL) effects due to the reduction in the supply voltages. This paper reports the results ...