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dc.contributor.authorAaboud, Morad
dc.contributor.authorAad, Georges
dc.contributor.authorAbbott, Brad
dc.contributor.authorAbbott, Dale C.
dc.contributor.authorAbdinov, Ovsat Bahram oglu
dc.contributor.authorAbhayasinghe, Deshan Kavishka
dc.contributor.authorAbidi, Syed Haider
dc.contributor.authorAbouZeid, Hass
dc.contributor.authorAbraham, Nadine L.
dc.contributor.authorAbramowicz, Halina
dc.contributor.authorBuanes, Trygve
dc.contributor.authorDjuvsland, Julia Isabell
dc.contributor.authorEigen, Gerald
dc.contributor.authorFomin, Nikolai
dc.contributor.authorLipniacka, Anna
dc.contributor.authorMartin dit Latour, Bertrand
dc.contributor.authorMæland, Steffen
dc.contributor.authorStugu, Bjarne
dc.contributor.authorYang, Zongchang
dc.contributor.authorBugge, Magnar Kopangen
dc.contributor.authorCameron, David Gordon
dc.contributor.authorCatmore, James Richard
dc.contributor.authorFeigl, Simon
dc.contributor.authorGaronne, Vincent
dc.contributor.authorGramstad, Eirik
dc.contributor.authorHellesund, Simen
dc.contributor.authorMorisbak, Vanja
dc.contributor.authorOppen, Henrik
dc.contributor.authorOuld-Saada, Farid
dc.contributor.authorPedersen, Maiken
dc.contributor.authorRead, Alexander Lincoln
dc.contributor.authorRøhne, Ole Myren
dc.contributor.authorSandaker, Heidi
dc.contributor.authorVadla, Knut Oddvar Høie
dc.contributor.authorAbreu, Henso
dc.contributor.authorAbulaiti, Yiming
dc.contributor.authorAcharya, Bobby S.
dc.contributor.authorAdachi, Shunsuke
dc.contributor.authorAdam, Lennart
dc.contributor.authorAdam-Bourdarios, Claire
dc.contributor.authorAdamczyk, Leszek
dc.contributor.authorAdamek, Lukas
dc.contributor.authorAdelman, Jareed
dc.contributor.authorAdersberger, Michael
dc.contributor.authorAdigüzel, Aytül
dc.contributor.authorAdye, Tim
dc.contributor.authorAffolder, Anthony Allen
dc.contributor.authorAfik, Yoav
dc.contributor.authorAgapopoulou, Christina
dc.contributor.authorAgaras, Merve Nazlim
dc.contributor.authorATLAS, Collaboration
dc.date.accessioned2020-08-10T13:01:43Z
dc.date.available2020-08-10T13:01:43Z
dc.date.issued2019
dc.PublishedAaboud M, Aad G, Abbott B, Abbott DC, Abdinov OBo, Abhayasinghe DK, Abidi SH, AbouZeid H, Abraham NL, Abramowicz H, Buanes T, Djuvsland JI, Eigen G, Fomin N, Lipniacka A, Martin dit Latour B, Mæland S, Stugu B, Yang Z, Bugge MK, Cameron DG, Catmore JR, Feigl S, Garonne V, Gramstad E, Hellesund S, Morisbak V, Oppen H, Ould-Saada F, Pedersen M, Read AL, Røhne OM, Sandaker H, Vadla KOH, Abreu H, Abulaiti Y, Acharya BS, Adachi S, Adam L, Adam-Bourdarios C, Adamczyk L, Adamek L, Adelman J, Adersberger M, Adigüzel A, Adye T, Affolder AA, Afik Y, Agapopoulou C, Agaras MN, ATLAS C. Modelling radiation damage to pixel sensors in the ATLAS detector. Journal of Instrumentation. 2019;14:P06012eng
dc.identifier.issn1748-0221en_US
dc.identifier.urihttps://hdl.handle.net/1956/23620
dc.description.abstractSilicon pixel detectors are at the core of the current and planned upgrade of the ATLAS experiment at the LHC. Given their close proximity to the interaction point, these detectors will be exposed to an unprecedented amount of radiation over their lifetime. The current pixel detector will receive damage from non-ionizing radiation in excess of 1015 1 MeV neq/cm2, while the pixel detector designed for the high-luminosity LHC must cope with an order of magnitude larger fluence. This paper presents a digitization model incorporating effects of radiation damage to the pixel sensors. The model is described in detail and predictions for the charge collection efficiency and Lorentz angle are compared with collision data collected between 2015 and 2017 (≤ 1015 1 MeV neq/cm2).en_US
dc.language.isoengeng
dc.publisherIOPen_US
dc.rightsAttribution CC BYeng
dc.rights.urihttp://creativecommons.org/licenses/by/3.0eng
dc.titleModelling radiation damage to pixel sensors in the ATLAS detectoren_US
dc.typePeer reviewed
dc.typeJournal article
dc.date.updated2019-11-25T12:23:36Z
dc.description.versionpublishedVersionen_US
dc.rights.holderCopyright 2019 CERN for the benefit of the ATLAS collaborationen_US
dc.identifier.doihttps://doi.org/10.1088/1748-0221/14/06/p06012
dc.identifier.cristin1730654
dc.source.journalJournal of Instrumentation
dc.subject.nsiVDP::Matematikk og naturvitenskap: 400::Fysikk: 430::Kjerne- og elementærpartikkelfysikk: 431
dc.subject.nsiVDP::Mathematics and natural scienses: 400::Physics: 430::Nuclear and elementary particle physics: 431


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