Browsing Bergen Open Research Archive by Author "Svensen, Øyvind"
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Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards
Svensen, Øyvind; Kildemo, Morten; Jerome, Maria; Stamnes, Jakob J.; Frette, Øyvind (Peer reviewed; Journal article, 2012)The full Mueller matrix for a Spectralon white reflectance standard was measured in the incidence plane, to obtain the polarization state of the scattered light for different angles of illumination. The experimental setup ...