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dc.contributor.authorFahy, Adam
dc.contributor.authorEder, Sabrina Daniela
dc.contributor.authorBarr, Matt
dc.contributor.authorMartens, Joel
dc.contributor.authorMyles, T.A.
dc.contributor.authorDastoor, Paul C.
dc.PublishedFahy A, Eder SD, Barr, Martens, Myles, Dastoor. Image formation in the scanning helium microscope. Ultramicroscopy. 2018;192:7-13eng
dc.description.abstractThe scanning helium microscope (SHeM) is a new addition to the array of available microscopies, particularly for delicate materials that may suffer damage under techniques utilising light or charged particles. As with all other microscopies, the specifics of image formation within the instrument are required to gain a full understanding of the produced micrographs. We present work detailing the basics of the subject for the SHeM, including the specific nature of the projection distortions that arise due to the scattering geometry. Extension of these concepts allowed for an iterative ray tracing Monte Carlo model replicating diffuse scattering from a sample surface to be constructed. Comparisons between experimental data and simulations yielded a minimum resolvable step height of (67 ± 5) µm and a minimum resolvable planar angle of (4.3 ± 0.3)° for the instrument in question.en_US
dc.rightsAttribution-NonCommercial-NoDerivs CC BY-NC-NDeng
dc.titleImage formation in the scanning helium microscopeen_US
dc.typePeer reviewed
dc.typeJournal article
dc.rights.holderCopyright 2018 Elsevieren_US
dc.relation.projectNorges forskningsråd: 250018

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