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dc.contributor.authorHeggelund, Andreas
dc.contributor.authorHuiberts, Simon Kristian
dc.contributor.authorDorholt, Ole
dc.contributor.authorRead, Alexander Lincoln
dc.contributor.authorRøhne, Ole Myren
dc.contributor.authorSandaker, Heidi
dc.contributor.authorLauritzen, Magne Eik
dc.contributor.authorStugu, Bjarne Sandvik
dc.contributor.authorKok, Angela
dc.contributor.authorKoybasi, Ozhan
dc.contributor.authorPovoli, Marco
dc.contributor.authorBomben, M.
dc.contributor.authorLange, J.
dc.contributor.authorRummler, André
dc.date.accessioned2023-01-09T15:21:38Z
dc.date.available2023-01-09T15:21:38Z
dc.date.created2022-08-22T13:39:00Z
dc.date.issued2022
dc.identifier.issn1748-0221
dc.identifier.urihttps://hdl.handle.net/11250/3042082
dc.description.abstractThe High Luminosity LHC (HL-LHC) upgrade requires the planned Inner Tracker (ITk) of the ATLAS detector to tolerate extremely high radiation doses. Specifically, the innermost parts of the pixel system will have to withstand radiation fluences above 1 × 1016 neqcm-2. Novel 3D silicon pixel sensors offer a superior radiation tolerance compared to conventional planar pixel sensors, and are thus excellent candidates for the innermost parts of the ITk. This paper presents studies of 3D pixel sensors with pixel size 50 × 50 μm2 mounted on the RD53A prototype readout chip. Following a description of the design and fabrication steps, Test Beam results are presented for unirradiated as well as heavily irradiated sensors. For particles passing at perpendicular incidence, it is shown that average efficiencies above 96% are reached for sensors exposed to fluences of 1 × 1016 neqcm-2 when biased to 80 V.en_US
dc.language.isoengen_US
dc.publisherIOP Publishingen_US
dc.rightsNavngivelse 4.0 Internasjonal
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no
dc.titleRadiation hard 3D silicon pixel sensors for use in the ATLAS detector at the HL-LHCen_US
dc.typeJournal articleen_US
dc.typePeer revieweden_US
dc.description.versionpublishedVersionen_US
dc.rights.holderCopyright 2022 CERNen_US
dc.source.articlenumberP08003en_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.doi10.1088/1748-0221/17/08/P08003
dc.identifier.cristin2044968
dc.source.journalJournal of Instrumentation (JINST)en_US
dc.identifier.citationJournal of Instrumentation (JINST). 2022, 17 (8), P08003.en_US
dc.source.volume17en_US
dc.source.issue8en_US


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